Abstract
The use of low dielectric constant (low-k) interdielectrics in multilevel structure integrated circuits (ICs) can lower line-to-line noise in interconnects and alleviate power dissipation issues by reducing the capacitance between the interconnect conductor lines. Because of these merits, low-k interdielectric materials are currently in high demand in the development of advanced ICs. This article reviews recent developments in the imprinting of closed nanopores into spin-on materials to produce low-k nanoporous interdielectrics for the production of advanced ICs.
| Original language | English |
|---|---|
| Pages (from-to) | 685-697 |
| Number of pages | 13 |
| Journal | Journal of Materials Chemistry |
| Volume | 16 |
| Issue number | 7 |
| DOIs | |
| State | Published - 2006 |