Improved morphology and bias stress study of a naphthalenetetracarboxylic diimide bottom contact field effect transistor

Jia Sun, Rod Devine, Bal M. Dhar, Byung Jun Jung, Kevin S. See, Howard E. Katz

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageEnglish
Title of host publication2009 International Semiconductor Device Research Symposium, ISDRS '09
DOIs
StatePublished - 2009
Event2009 International Semiconductor Device Research Symposium, ISDRS '09 - College Park, MD, United States
Duration: 9 Dec 200911 Dec 2009

Publication series

Name2009 International Semiconductor Device Research Symposium, ISDRS '09

Conference

Conference2009 International Semiconductor Device Research Symposium, ISDRS '09
Country/TerritoryUnited States
CityCollege Park, MD
Period9/12/0911/12/09

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