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Dive into the research topics of 'Improvement of characteristics with a sub-5 nm ge-doped silicon nitride layer in charge trap flash memory cells'. Together they form a unique fingerprint.- Sort by
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Dong Hua Li, Wandong Kim, Won Bo Shim, Se Hwan Park, Yoon Kim, Gil Sung Lee, Doo Hyun Kim, Jung Hoon Lee, Jang Gn Yun, Seongjae Cho, Il Han Park, Jong Ho Lee, Hyungcheol Shin, Byung Gook Park
Research output: Contribution to journal › Article › peer-review