In-situ observation and characterization of structural evolution in a phase-change memory device by TEM-STM

Dongkyu Cha, S. Y. Park, Su Jin Ahn, H. Horii, D. H. Kim, Y. K. Kim, S. O. Park, U. In Jung, Moon J. Kim, Jiyoung Kim

Research output: Contribution to journalArticlepeer-review

1 Scopus citations
Original languageEnglish
Pages (from-to)716-717
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Jul 2009

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