Influence of polar face on optical properties of staggered 440 nm InGaN/InGaN/GaN quantum-well light-emitting diodes

S. H. Park, B. H. Kim, D. Ahn, Y. T. Lee

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The influence of the polar plane on optical properties of staggered InGaN/InGaN/GaN quantum well (QW) light-emitting diodes was investigated using the multiband effective mass theory. The N-face staggered InGaN/InGaN/GaN QW structure has a greater spontaneous emission peak than the Gaface staggered InGaN/InGaN/GaN QW structure because the before has a larger matrix element than the latter. On the other hand, the heavy-hole effective mass around the topmost valence band is not affected nearly by the polarity. We expect that the N-face staggered InGaN/InGaN/GaN QW structure has an improved characteristics compared to the Ga-face staggered InGaN/InGaN/GaN QW structure.

Original languageEnglish
Title of host publication10th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2010
Pages93-94
Number of pages2
DOIs
StatePublished - 2010
Event10th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2010 - Atlanta, GA, United States
Duration: 6 Sep 20109 Sep 2010

Publication series

Name10th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2010

Conference

Conference10th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2010
Country/TerritoryUnited States
CityAtlanta, GA
Period6/09/109/09/10

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