@inproceedings{5e5bef27eba64379b879d631fe160c05,
title = "Input Image Pixel Interval method for Classification Using Transfer Learning",
abstract = "Deep learning has been used in many applications where patterns from past-trained data can be extracted to predict future outcomes. Deep learning is characterized by training and testing data with the identical input feature space and same data distribution. However, whereas the data distribution is same between the training and testing data, the results might be different. This study introduces input image preprocessing, an enhanced neural network optimization method, and prediction probability ensemble to minimize the number of trainable parameters but maintain the outcome accuracy. In the suggested methodology, input images are separated into pixel interval and the fully connected layer jointly used with saved weights. Outcome results of separated input images are ensembled to the corresponding class probabilities of the original image. The results of the proposed method were compared with those of other previous methods in the image classification task and achieved successful performance accuracies in several datasets.",
keywords = "classification probability, ensemble learning, model optimization",
author = "Abdulaziz Anorboev and Musaev Javokhir and Jeongkyu Hong and Nguyen, {Ngoc Thanh} and Dosam Hwang",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 16th International Conference on INnovations in Intelligent SysTems and Applications, INISTA 2022 ; Conference date: 08-08-2022 Through 12-08-2022",
year = "2022",
doi = "10.1109/INISTA55318.2022.9894179",
language = "English",
series = "16th International Conference on INnovations in Intelligent SysTems and Applications, INISTA 2022",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
editor = "Richard Chbeir and Tulay Yildirim and Ladjel Bellatreche and Yannis Manolopoulos and Apostolos Papadopoulos and Chaaya, {Karam Bou}",
booktitle = "16th International Conference on INnovations in Intelligent SysTems and Applications, INISTA 2022",
address = "United States",
}