Investigation into the effect of the variation of gate dimensions on program characteristics in 3D NAND flash array
- Joo Yun Seo
- , Yoon Kim
- , Se Hwan Park
- , Wandong Kim
- , Do Bin Kim
- , Jong Ho Lee
- , Hyungcheol Shin
- , Byung Gook Park
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
3
Scopus
citations