Investigation of frequency dependent sensitivity of noise figure on device parameters in 65 nm CMOS

Minsuk Koo; Hakchul Jung; Heesauk Jhon; Byung Gook Park; Jong Duk Lee; Hyungeheol Shin

doi:10.5573/JSTS.2009.9.1.061

Investigation of frequency dependent sensitivity of noise figure on device parameters in 65 nm CMOS

Minsuk Koo
, Hakchul Jung
, Heesauk Jhon
, Byung Gook Park
, Jong Duk Lee
, Hyungeheol Shin

School of Advanced Fusion Studies

Seoul National University

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

We have investigated the noise sensitivity of low noise amplifier (LNA) at different frequency. This noise sensitivity analysis provides insights about noise parameters and it is very beneficial for making appropriate design trade-offs. From this work, the circuit designer can choose the adequate noise parameters tolerances.

Original language	English
Pages (from-to)	61-66
Number of pages	6
Journal	Journal of Semiconductor Technology and Science
Volume	9
Issue number	1
DOIs	https://doi.org/10.5573/JSTS.2009.9.1.061
State	Published - Mar 2009

Keywords

CMOS
LNA
Low noise amplifier
Noise sensitivity
Optimization

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10.5573/JSTS.2009.9.1.061

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title = "Investigation of frequency dependent sensitivity of noise figure on device parameters in 65 nm CMOS",

abstract = "We have investigated the noise sensitivity of low noise amplifier (LNA) at different frequency. This noise sensitivity analysis provides insights about noise parameters and it is very beneficial for making appropriate design trade-offs. From this work, the circuit designer can choose the adequate noise parameters tolerances.",

keywords = "CMOS, LNA, Low noise amplifier, Noise sensitivity, Optimization",

author = "Minsuk Koo and Hakchul Jung and Heesauk Jhon and Park, \{Byung Gook\} and Lee, \{Jong Duk\} and Hyungeheol Shin",

year = "2009",

month = mar,

doi = "10.5573/JSTS.2009.9.1.061",

language = "English",

volume = "9",

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AU - Koo, Minsuk

AU - Jung, Hakchul

AU - Jhon, Heesauk

AU - Park, Byung Gook

AU - Lee, Jong Duk

AU - Shin, Hyungeheol

PY - 2009/3

Y1 - 2009/3

N2 - We have investigated the noise sensitivity of low noise amplifier (LNA) at different frequency. This noise sensitivity analysis provides insights about noise parameters and it is very beneficial for making appropriate design trade-offs. From this work, the circuit designer can choose the adequate noise parameters tolerances.

AB - We have investigated the noise sensitivity of low noise amplifier (LNA) at different frequency. This noise sensitivity analysis provides insights about noise parameters and it is very beneficial for making appropriate design trade-offs. From this work, the circuit designer can choose the adequate noise parameters tolerances.

KW - CMOS

KW - LNA

KW - Low noise amplifier

KW - Noise sensitivity

KW - Optimization

UR - https://www.scopus.com/pages/publications/65349166394

U2 - 10.5573/JSTS.2009.9.1.061

DO - 10.5573/JSTS.2009.9.1.061

M3 - Article

AN - SCOPUS:65349166394

SN - 1598-1657

VL - 9

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EP - 66

JO - Journal of Semiconductor Technology and Science

JF - Journal of Semiconductor Technology and Science

IS - 1

ER -

Investigation of frequency dependent sensitivity of noise figure on device parameters in 65 nm CMOS

Abstract

Keywords

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