Investigation on Parylene-C based neural electrodes by accelerated life test and reliability improvement using polyimide flexible cable

Ju Hwan Kim, Dong Hyun Baek, Dae Hwan Kim, Dong Wook Park

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

Since the encapsulation layer of the neural electrode plays an important role in determining the reliability of the device, more studies on the long-term reliability of Parylene-C are required. In this paper, we described the long-term reliability of Parylene-C based neural electrodes through an accelerated lift test and proposed a method to improve the reliability using polyimide flexible cable (PFC) attached to the Parylene-C device. The accelerated lifetime test was performed in phosphate-buffered saline at 50 °C. The electrochemical characteristics were acquired and analyzed to evaluate the reliability of the Parylene-C coated neural electrode for up to 56 days, which is equivalent to 115 days as an accelerated time. The proposed PFC method showed improved long-term stability of the device, demonstrating an increased lifetime, showing that testing conditions and device setup affect overall results. This study will help make reliable Parylene-C based neural electrode systems with improved moisture protection.

Original languageEnglish
Pages (from-to)214-220
Number of pages7
JournalCurrent Applied Physics
Volume39
DOIs
StatePublished - Jul 2022

Keywords

  • Accelerated life test
  • Long-term reliability
  • Neural electrode
  • Parylene-C

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