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IR absorption property in nano-thick Ir-inserted nickel silicides
Kijeong Yoon
,
Ohsung Song
, Jeungjo Han
Department of Materials Science and Engineering
University of Seoul
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Engineering
Substrates
100%
Transmissions
66%
Polycrystalline
66%
Microstructure
33%
Determines
33%
Energy Conservation
33%
Rapid Thermal Annealing
33%
Fourier Transform
33%
Polysilicon
33%
Temperature Range
33%
Silicon Substrate
33%
Material Science
Nickel
100%
Silicide
100%
Absorbance
71%
Indium Tin Oxide
57%
Temperature
14%
Microstructure
14%
Silicon
14%
Crystalline Material
14%
Annealing
14%
Fourier Transform Infrared Spectroscopy
14%
Electron Microscopy
14%
Physics
Region
100%
Nickel
100%
Substrates
80%
Electron Microscope
40%
Temperature
20%
Silicon
20%
X Ray
20%
FTIR Spectroscopy
20%
Phase Change
20%