Keto defect sites in fluorene-based organic field-effect transistors: The origin of rapid degradation on the performance of the device
- Yong Young Noh
- , Dong Yu Kim
- , Yuji Yoshida
- , Kiyoshi Yase
- , Byung Jun Jung
- , Eunhee Lim
- , Hong Ku Shim
- , Reiko Azumi
- Gwangju Institute of Science and Technology
- National Institute of Advanced Industrial Science and Technology
- Korea Advanced Institute of Science and Technology
Research output: Contribution to journal › Article › peer-review
28
Scopus
citations