Low-K nanoporous interdielectrics: Materials, thin film fabrications, structures and properties

Moonhor Ree, Jinhwan Yoon, Kyuyoung Heo

Research output: Book/ReportBookpeer-review

1 Scopus citations

Abstract

The use of low dielectric constant (low-k) interdielectrics in multilevel structure integrated circuits (ICs) can lower line-to-line noise in interconnects and alleviate power dissipation issues by reducing the capacitance between the interconnect conductor lines. Because of these merits, low-k interdielectric materials are currently in high demand in the development of advanced ICs. One important approach to obtaining low-k values is the incorporation of nanopores into dielectrics. This book provides an overview of the methodologies and characterization techniques used for investigating low-k nanoporous interdielectrics.

Original languageEnglish
PublisherNova Science Publishers, Inc.
Number of pages67
ISBN (Print)9781616687496
StatePublished - 2010

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