Abstract
The use of low dielectric constant (low-k) interdielectrics in multilevel structure integrated circuits (ICs) can lower line-to-line noise in interconnects and alleviate power dissipation issues by reducing the capacitance between the interconnect conductor lines. Because of these merits, low-k interdielectric materials are currently in high demand in the development of advanced ICs. One important approach to obtaining low-k values is the incorporation of nanopores into dielectrics. This book provides an overview of the methodologies and characterization techniques used for investigating low-k nanoporous interdielectrics.
| Original language | English |
|---|---|
| Publisher | Nova Science Publishers, Inc. |
| Number of pages | 67 |
| ISBN (Print) | 9781616687496 |
| State | Published - 2010 |
Fingerprint
Dive into the research topics of 'Low-K nanoporous interdielectrics: Materials, thin film fabrications, structures and properties'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver