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Dive into the research topics of 'Low temperature characterization of PMOS-type gate-all-around silicon nanowire FETs as single-hole-transistors'. Together they form a unique fingerprint.- Sort by
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B. H. Hong, S. W. Hwang, Y. Y. Lee, M. H. Son, D. Ahn, K. H. Cho, K. H. Yeo, D. W. Kim, G. Y. Jin, D. Park
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review