Low temperature characterization of PMOS-type gate-all-around silicon nanowire FETs as single-hole-transistors

  • B. H. Hong
  • , S. W. Hwang
  • , Y. Y. Lee
  • , M. H. Son
  • , D. Ahn
  • , K. H. Cho
  • , K. H. Yeo
  • , D. W. Kim
  • , G. Y. Jin
  • , D. Park

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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