Macromodeling of single-electron transistors for efficient circuit simulation

Yun Seop Yu, Sung Woo Hwang, Doyeol Ahn

Research output: Contribution to journalArticlepeer-review

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In this study, the possibility of compact modeling in single-electron circuit simulation has been investigated. It is found that each Coulomb island in single-electron circuits can be treated independently when the interconnections between single-electron transistors are large enough and a quantitative criterion for this condition is given. It is also demonstrated that, in those situations, SPICE macromodeling of single-electron transistors can be used for efficient circuit simulation. The developed macromodel produces simulation results with reasonable accuracy and with orders of magnitude less CPU time than usual Monte Carlo simulations.

Original languageEnglish
Pages (from-to)1667-1671
Number of pages5
JournalIEEE Transactions on Electron Devices
Issue number8
StatePublished - Aug 1999


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