Microgap gas chamber studies

H. S. Cho; W. S. Hong; N. Palaio; J. Kadyk; K. B. Luk; V. Perez-Mendez

Microgap gas chamber studies

H. S. Cho, W. S. Hong, N. Palaio, J. Kadyk, K. B. Luk, V. Perez-Mendez

Department of Materials Science and Engineering

University of California at Berkeley

Research output: Contribution to conference › Paper › peer-review

Abstract

Hydrogenated amorphous silicon carbide (a-Si:C:H) has been used as an insulating support pedestal for the anode strip in microgap gas chambers (MGCs) in an attempt to make a thicker high quality insulating layer. MGCs having 2.3 or 4.6 μm thick a-Si:C:H and 2.0 μm thick SiO₂ insulating layers have been built and tested. In this paper, the results of gas gains, strip damage by discharges, and preliminary aging studies are presented.

Original language	English
Pages	148-152
Number of pages	5
State	Published - 1995
Event	Proceedings of the 1995 IEEE Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 3) - San Francisco, CA, USA Duration: 21 Oct 1995 → 28 Oct 1995

Conference

Conference	Proceedings of the 1995 IEEE Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 3)
City	San Francisco, CA, USA
Period	21/10/95 → 28/10/95

Cite this

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title = "Microgap gas chamber studies",

abstract = "Hydrogenated amorphous silicon carbide (a-Si:C:H) has been used as an insulating support pedestal for the anode strip in microgap gas chambers (MGCs) in an attempt to make a thicker high quality insulating layer. MGCs having 2.3 or 4.6 μm thick a-Si:C:H and 2.0 μm thick SiO2 insulating layers have been built and tested. In this paper, the results of gas gains, strip damage by discharges, and preliminary aging studies are presented.",

author = "Cho, {H. S.} and Hong, {W. S.} and N. Palaio and J. Kadyk and Luk, {K. B.} and V. Perez-Mendez",

year = "1995",

language = "English",

pages = "148--152",

note = "Proceedings of the 1995 IEEE Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 3) ; Conference date: 21-10-1995 Through 28-10-1995",

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TY - CONF

T1 - Microgap gas chamber studies

AU - Cho, H. S.

AU - Hong, W. S.

AU - Palaio, N.

AU - Kadyk, J.

AU - Luk, K. B.

AU - Perez-Mendez, V.

PY - 1995

Y1 - 1995

N2 - Hydrogenated amorphous silicon carbide (a-Si:C:H) has been used as an insulating support pedestal for the anode strip in microgap gas chambers (MGCs) in an attempt to make a thicker high quality insulating layer. MGCs having 2.3 or 4.6 μm thick a-Si:C:H and 2.0 μm thick SiO2 insulating layers have been built and tested. In this paper, the results of gas gains, strip damage by discharges, and preliminary aging studies are presented.

AB - Hydrogenated amorphous silicon carbide (a-Si:C:H) has been used as an insulating support pedestal for the anode strip in microgap gas chambers (MGCs) in an attempt to make a thicker high quality insulating layer. MGCs having 2.3 or 4.6 μm thick a-Si:C:H and 2.0 μm thick SiO2 insulating layers have been built and tested. In this paper, the results of gas gains, strip damage by discharges, and preliminary aging studies are presented.

UR - http://www.scopus.com/inward/record.url?scp=0029452147&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0029452147

SP - 148

EP - 152

T2 - Proceedings of the 1995 IEEE Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 3)

Y2 - 21 October 1995 through 28 October 1995

ER -

Microgap gas chamber studies

Abstract

Conference

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