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Microgap gas chamber studies

  • H. S. Cho
  • , W. S. Hong
  • , N. Palaio
  • , J. Kadyk
  • , K. B. Luk
  • , V. Perez-Mendez
  • University of California at Berkeley

Research output: Contribution to conference › Paper › peer-review

Abstract

Hydrogenated amorphous silicon carbide (a-Si:C:H) has been used as an insulating support pedestal for the anode strip in microgap gas chambers (MGCs) in an attempt to make a thicker high quality insulating layer. MGCs having 2.3 or 4.6 μm thick a-Si:C:H and 2.0 μm thick SiO2 insulating layers have been built and tested. In this paper, the results of gas gains, strip damage by discharges, and preliminary aging studies are presented.

Original languageEnglish
Pages148-152
Number of pages5
StatePublished - 1995
EventProceedings of the 1995 IEEE Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 3) - San Francisco, CA, USA
Duration: 21 Oct 1995 → 28 Oct 1995

Conference

ConferenceProceedings of the 1995 IEEE Nuclear Science Symposium and Medical Imaging Conference. Part 1 (of 3)
CitySan Francisco, CA, USA
Period21/10/95 → 28/10/95

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