Micromachined planar probe using half-SIW and half-shielded stripline structure for permittivity measurement

  • Yong Seung Bang
  • , Namgon Kim
  • , Jung Mu Kim
  • , Changyul Cheon
  • , Youngwoo Kwon
  • , Yong Kweon Kim

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

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