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Micromachined planar probe using half-SIW and half-shielded stripline structure for permittivity measurement
Yong Seung Bang, Namgon Kim, Jung Mu Kim, Changyul Cheon, Youngwoo Kwon, Yong Kweon Kim
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2
Scopus
citations