Multi-layer processed probes for permittivity measurement

Eum Min Jeong, Geunseok Jeong, Jung Mu Kim, Jae Hyoung Park, Jei Won Cho, Changyul Cheon, Yong Kweon Kim, Youngwoo Kwon

Research output: Contribution to journalConference articlepeer-review

5 Scopus citations


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Chemical Engineering