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Neutron Irradiation-Induced Trap States and Electrical Performance Degradation in ReS2 Field-Effect Transistors

  • Seung Yong Back
  • , Gyeong Deok Seo
  • , Ji Won Heo
  • , Hagyoul Bae
  • , Bong Ki Jung
  • , Tae Wan Kim
  • University of Seoul
  • Jeonbuk National University
  • Q-beam solution Inc.

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

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