Abstract
Using sequential ion milling the authors have studied the thickness dependence of the critical current density J c(H) of a single crystal 1 μm thick YBa 2Cu 3O 7-x thin film containing ∼5 vol % of insulating Y 2BaCuO 5 (Y211) nanoparticles in order to better understand how to obtain high critical currents in thick films. Except very near the interface where the defect density was enhanced, J c(H) in the body of the film was uniform and independent of thickness with a high maximum pinning force of 8.8 GN/m 3 at 77 K. The authors conclude that the nanoscale Y211 precipitates result in strong, three-dimensional pinning characterized by a pin spacing of ∼30 nm, much smaller than thefilm thickness.
Original language | English |
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Article number | 252502 |
Journal | Applied Physics Letters |
Volume | 90 |
Issue number | 25 |
DOIs | |
State | Published - 2007 |