Origin of charge transfer complex resulting in Ohmic contact at the C60/Cu interface
- S. W. Cho
- , Y. Yi
- , J. H. Seo
- , C. Y. Kim
- , M. Noh
- , K. H. Yoo
- , K. Jeong
- , C. N. Whang
- Yonsei University
- Korea Research Institute of Standards and Science
- LOT Vacuum Co. Ltd.
Research output: Contribution to journal › Article › peer-review
13
Scopus
citations