Performance characteristics of flash memory: Model and implications

Seungjae Baek, Jongmoo Choi, Donghee Lee, Sam H. Noh

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

In this paper, we propose a model to identify the cost of block cleaning of Flash memory. The model defines three performance parameters, namely, utilization, invalidity, and uniformity and presents a formula for estimating the block cleaning cost based on these parameters. Then, we design a new modification-aware (MODA) page allocation scheme which can improve the block cleaning cost by enhancing uniformity of Flash memory. Real implementation experiments conducted on an embedded system show that the MODA scheme can reduce block cleaning time by up to 43 seconds (with an average of 10.2 seconds) compared to the traditional sequential allocation scheme that is used in YAFFS.

Original languageEnglish
Title of host publicationEmbedded Software and Systems - Third International Conference, ICESS 2007, Proceedings
PublisherSpringer Verlag
Pages162-173
Number of pages12
ISBN (Print)3540726845, 9783540726845
DOIs
StatePublished - 2007
Event3rd International Conference on Embedded Software and Systems, ICESS 2007 - Daegu, Korea, Republic of
Duration: 14 May 200716 May 2007

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume4523 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference3rd International Conference on Embedded Software and Systems, ICESS 2007
Country/TerritoryKorea, Republic of
CityDaegu
Period14/05/0716/05/07

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