Performance of microdot (MDOT) detectors with conductive coating of doped amorphous silicon carbide (a-Si:C:H)

H. S. Cho; W. S. Hong; J. Kadyk; V. Perez-Mendez

doi:10.1016/S0168-9002(98)00961-9

Performance of microdot (MDOT) detectors with conductive coating of doped amorphous silicon carbide (a-Si:C:H)

H. S. Cho, W. S. Hong, J. Kadyk, V. Perez-Mendez

Department of Materials Science and Engineering

Lawrence Berkeley National Laboratory

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

A conductive coating of doped amorphous silicon carbide (a-Si:C:H) has been used in the fabrication of microdot (MDOT) detectors, to minimize the defocusing, away from the anodes, of the drifting primary electrons. This defocusing is caused by the existence of the readout line passing below the insulating layer. The defocusing effect and other effects of the conductive coating on the performance of these detectors fabricated in this way have been investigated.

Original language	English
Pages (from-to)	296-299
Number of pages	4
Journal	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume	422
Issue number	1-3
DOIs	https://doi.org/10.1016/S0168-9002(98)00961-9
State	Published - 1999

Keywords

Conductive coating
Defocusing
Doped amorphous silicon caribide
Microdot detectors

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10.1016/S0168-9002(98)00961-9

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title = "Performance of microdot (MDOT) detectors with conductive coating of doped amorphous silicon carbide (a-Si:C:H)",

abstract = "A conductive coating of doped amorphous silicon carbide (a-Si:C:H) has been used in the fabrication of microdot (MDOT) detectors, to minimize the defocusing, away from the anodes, of the drifting primary electrons. This defocusing is caused by the existence of the readout line passing below the insulating layer. The defocusing effect and other effects of the conductive coating on the performance of these detectors fabricated in this way have been investigated.",

keywords = "Conductive coating, Defocusing, Doped amorphous silicon caribide, Microdot detectors",

author = "Cho, {H. S.} and Hong, {W. S.} and J. Kadyk and V. Perez-Mendez",

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Cho, HS, Hong, WS, Kadyk, J & Perez-Mendez, V 1999, 'Performance of microdot (MDOT) detectors with conductive coating of doped amorphous silicon carbide (a-Si:C:H)', Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 422, no. 1-3, pp. 296-299. https://doi.org/10.1016/S0168-9002(98)00961-9

Performance of microdot (MDOT) detectors with conductive coating of doped amorphous silicon carbide (a-Si:C:H). / Cho, H. S.; Hong, W. S.; Kadyk, J. et al.
In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 422, No. 1-3, 1999, p. 296-299.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Performance of microdot (MDOT) detectors with conductive coating of doped amorphous silicon carbide (a-Si:C:H)

AU - Cho, H. S.

AU - Hong, W. S.

AU - Kadyk, J.

AU - Perez-Mendez, V.

PY - 1999

Y1 - 1999

N2 - A conductive coating of doped amorphous silicon carbide (a-Si:C:H) has been used in the fabrication of microdot (MDOT) detectors, to minimize the defocusing, away from the anodes, of the drifting primary electrons. This defocusing is caused by the existence of the readout line passing below the insulating layer. The defocusing effect and other effects of the conductive coating on the performance of these detectors fabricated in this way have been investigated.

AB - A conductive coating of doped amorphous silicon carbide (a-Si:C:H) has been used in the fabrication of microdot (MDOT) detectors, to minimize the defocusing, away from the anodes, of the drifting primary electrons. This defocusing is caused by the existence of the readout line passing below the insulating layer. The defocusing effect and other effects of the conductive coating on the performance of these detectors fabricated in this way have been investigated.

KW - Conductive coating

KW - Defocusing

KW - Doped amorphous silicon caribide

KW - Microdot detectors

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JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

IS - 1-3

ER -

Performance of microdot (MDOT) detectors with conductive coating of doped amorphous silicon carbide (a-Si:C:H)

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Keywords

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