Physics-Based Compact Model of Current Stress-Induced Threshold Voltage Shift in Top-Gate Self-Aligned Amorphous InGaZnO Thin-Film Transistors

  • Tae Jun Yang
  • , Jingyu Park
  • , Sungju Choi
  • , Changwook Kim
  • , Moonsup Han
  • , Jong Ho Bae
  • , Sung Jin Choi
  • , Dong Myong Kim
  • , Hong Jae Shin
  • , Yun Sik Jeong
  • , Jong Uk Bae
  • , Chang Ho Oh
  • , Dong Wook Park
  • , Dae Hwan Kim

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

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