Physics-Based Compact Model of Current Stress-Induced Threshold Voltage Shift in Top-Gate Self-Aligned Amorphous InGaZnO Thin-Film Transistors

Tae Jun Yang, Jingyu Park, Sungju Choi, Changwook Kim, Moonsup Han, Jong Ho Bae, Sung Jin Choi, Dong Myong Kim, Hong Jae Shin, Yun Sik Jeong, Jong Uk Bae, Chang Ho Oh, Dong Wook Park, Dae Hwan Kim

Research output: Contribution to journal › Article › peer-review

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