Polarization relaxation induced by a depolarization field in ultrathin ferroelectric BaTiO3 capacitors

D. J. Kim, J. Y. Jo, Y. S. Kim, Y. J. Chang, J. S. Lee, Jong Gul Yoon, T. K. Song, T. W. Noh

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317 Scopus citations

Abstract

Time-dependent polarization relaxation behavior induced by a depolarization field Ed was investigated on high-quality ultrathin SrRuO3/BaTiO3/SrRuO3 capacitors. The Ed values were determined experimentally from an applied external field to stop the net polarization relaxation. These values agree with those from the electrostatic calculations, demonstrating that a large Ed inside the ultrathin ferroelectric layer could cause severe polarization relaxation. For numerous ferroelectric devices of capacitor configuration, this effect will set a stricter size limit than the critical thickness issue.

Original languageEnglish
Article number237602
JournalPhysical Review Letters
Volume95
Issue number23
DOIs
StatePublished - 2 Dec 2005

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