Polystyrene-b-polyisoprene thin films with hexagonally perforated layer structure: Quantitative grazing-incidence X-ray scattering analysis

Kyuyoung Heo; Jinhwan Yoon; Sangwoo Jin; Jehan Kim; Kwang Woo Kim; Tae Joo Shin; Bonghoon Chung; Taihyun Chang; Moonhor Ree

doi:10.1107/S0021889808001271

Polystyrene-b-polyisoprene thin films with hexagonally perforated layer structure: Quantitative grazing-incidence X-ray scattering analysis

Kyuyoung Heo
, Jinhwan Yoon
, Sangwoo Jin
, Jehan Kim
, Kwang Woo Kim
, Tae Joo Shin
, Bonghoon Chung
, Taihyun Chang
, Moonhor Ree

Department of Chemical Engineering

Pohang University of Science and Technology

Research output: Contribution to journal › Article › peer-review

43 Scopus citations

Abstract

Grazing-incidence X-ray scattering (GIXS) formulas for hexagonally perforated layer (HPL) structures with ABC and AB stacking sequences were derived, and used in the quantitative analysis of the two-dimensional GIXS patterns of polystyrene-b-polyisoprene (PS-b-PI) diblock copolymer thin films supported on silicon substrates. This quantitative analysis provided detailed information (shape, size and size distribution, packing order, layer packing sequence, and orientation) about the HPL structure of the diblock copolymer films that cannot be easily obtained with conventional X-ray and neutron scattering techniques or with conventional microscopic methods.

Original language	English
Pages (from-to)	281-291
Number of pages	11
Journal	Journal of Applied Crystallography
Volume	41
Issue number	2
DOIs	https://doi.org/10.1107/S0021889808001271
State	Published - 8 Mar 2008

Keywords

Grazing-incidence X-ray scattering
Hexagonally perforated layer structures
Layer stacking sequences
Orientation order
Paracrystal theory
Polystyrene-b-polyisoprene diblock copolymer thin films
Positional distortion factors

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10.1107/S0021889808001271

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@article{f233673a3ea24d82aa520eed89d388d9,

title = "Polystyrene-b-polyisoprene thin films with hexagonally perforated layer structure: Quantitative grazing-incidence X-ray scattering analysis",

abstract = "Grazing-incidence X-ray scattering (GIXS) formulas for hexagonally perforated layer (HPL) structures with ABC and AB stacking sequences were derived, and used in the quantitative analysis of the two-dimensional GIXS patterns of polystyrene-b-polyisoprene (PS-b-PI) diblock copolymer thin films supported on silicon substrates. This quantitative analysis provided detailed information (shape, size and size distribution, packing order, layer packing sequence, and orientation) about the HPL structure of the diblock copolymer films that cannot be easily obtained with conventional X-ray and neutron scattering techniques or with conventional microscopic methods.",

keywords = "Grazing-incidence X-ray scattering, Hexagonally perforated layer structures, Layer stacking sequences, Orientation order, Paracrystal theory, Polystyrene-b-polyisoprene diblock copolymer thin films, Positional distortion factors",

author = "Kyuyoung Heo and Jinhwan Yoon and Sangwoo Jin and Jehan Kim and Kim, \{Kwang Woo\} and Shin, \{Tae Joo\} and Bonghoon Chung and Taihyun Chang and Moonhor Ree",

year = "2008",

month = mar,

day = "8",

doi = "10.1107/S0021889808001271",

language = "English",

volume = "41",

pages = "281--291",

journal = "Journal of Applied Crystallography",

issn = "0021-8898",

publisher = "International Union of Crystallography",

number = "2",

}

TY - JOUR

T1 - Polystyrene-b-polyisoprene thin films with hexagonally perforated layer structure

T2 - Quantitative grazing-incidence X-ray scattering analysis

AU - Heo, Kyuyoung

AU - Yoon, Jinhwan

AU - Jin, Sangwoo

AU - Kim, Jehan

AU - Kim, Kwang Woo

AU - Shin, Tae Joo

AU - Chung, Bonghoon

AU - Chang, Taihyun

AU - Ree, Moonhor

PY - 2008/3/8

Y1 - 2008/3/8

N2 - Grazing-incidence X-ray scattering (GIXS) formulas for hexagonally perforated layer (HPL) structures with ABC and AB stacking sequences were derived, and used in the quantitative analysis of the two-dimensional GIXS patterns of polystyrene-b-polyisoprene (PS-b-PI) diblock copolymer thin films supported on silicon substrates. This quantitative analysis provided detailed information (shape, size and size distribution, packing order, layer packing sequence, and orientation) about the HPL structure of the diblock copolymer films that cannot be easily obtained with conventional X-ray and neutron scattering techniques or with conventional microscopic methods.

AB - Grazing-incidence X-ray scattering (GIXS) formulas for hexagonally perforated layer (HPL) structures with ABC and AB stacking sequences were derived, and used in the quantitative analysis of the two-dimensional GIXS patterns of polystyrene-b-polyisoprene (PS-b-PI) diblock copolymer thin films supported on silicon substrates. This quantitative analysis provided detailed information (shape, size and size distribution, packing order, layer packing sequence, and orientation) about the HPL structure of the diblock copolymer films that cannot be easily obtained with conventional X-ray and neutron scattering techniques or with conventional microscopic methods.

KW - Grazing-incidence X-ray scattering

KW - Hexagonally perforated layer structures

KW - Layer stacking sequences

KW - Orientation order

KW - Paracrystal theory

KW - Polystyrene-b-polyisoprene diblock copolymer thin films

KW - Positional distortion factors

UR - https://www.scopus.com/pages/publications/40849136139

U2 - 10.1107/S0021889808001271

DO - 10.1107/S0021889808001271

M3 - Article

AN - SCOPUS:40849136139

SN - 0021-8898

VL - 41

SP - 281

EP - 291

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

IS - 2

ER -

Polystyrene-b-polyisoprene thin films with hexagonally perforated layer structure: Quantitative grazing-incidence X-ray scattering analysis

Abstract

Keywords

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