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Quantitative analysis of lamellar structures in brush polymer thin films by synchrotron grazing-incidence X-ray scattering
Jinhwan Yoon, Kyeong Sik Jin, Hyun Chul Kim, Gahee Kim, Kyuyoung Heo, Sangwoo Jin, Jehan Kim, Kwang Woo Kim, Moonhor Ree
Research output: Contribution to journal › Article › peer-review