Quantitative analysis of molecularly stacked layer structures in supported organic thin films by synchrotron grazing-incidence X-ray scattering

Jinhwan Yoon, Seungchel Choi, Sangwoo Jin, Kyeong Sik Jin, Kyuyoung Heo, Moonhor Ree

Research output: Contribution to journal › Article › peer-review

19 Scopus citations

Fingerprint

Dive into the research topics of 'Quantitative analysis of molecularly stacked layer structures in supported organic thin films by synchrotron grazing-incidence X-ray scattering'. Together they form a unique fingerprint.