Quantitative synchrotron grazing incidence X-ray scattering analysis of cylindrical nanostructures in supported thin films

Jinhwan Yoon, Seung Yun Yang, Kyuyoung Heo, Byeongdu Lee, Wonchul Joo, Jin Kon Kim, Moonhor Ree

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Nondestructive nanostructural analysis is indispensable in the development of nano-materials and nano-fabrication processes for use in nanotechnology applications. In this paper, we demonstrate a quantitative, nondestructive analysis of nanostructured thin films supported on substrates and their templated nanopores by using grazing incidence X-ray scattering and data analysis with a derived scattering theory. Our analysis disclosed that vertically oriented nanodomain cylinders had formed in 20-100 nm thick films supported on substrates, which were consisting of a mixture of poly(styrene-b-methyl methacrylate) (PS-b-PMMA) and PMMA homopolymer, and that the PMMA nanodomain cylinders were selectively etched out by ultraviolet light exposure and a subsequent rinse with acetic acid, resulting in a well-ordered nanostructure consisting of hexagonally packed cylindrical nanopores.

Original languageEnglish
Title of host publication2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings
Pages113-115
Number of pages3
StatePublished - 2007
Event2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007 - Santa Clara, CA, United States
Duration: 20 May 200724 May 2007

Publication series

Name2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007, Technical Proceedings
Volume4

Conference

Conference2007 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2007
Country/TerritoryUnited States
CitySanta Clara, CA
Period20/05/0724/05/07

Keywords

  • Grazing incidence X-ray scattering
  • Nanostructure template
  • Porous nanocylinder
  • Quantitative scattering data analysis

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