Role of SrRuO3 buffer layers in enhancing resistance changing of Pr0.7Ca0.3MnO3 films

Seunawoo Han, Kyoungwan Park, Junghyun Sok

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Resistance-switching behaviors of the Pr0.7Ca 0.3MnO3(PCMO) films based metal-insulator-metal (MIM) devices has been investigated. In this work, resistance change of PCMO films deposited with SRO buffer layers by using RF-magnetron sputtering system investigated at room temperature. The ratio of the resistance change of the PCMO films with SRO buffer layers in the high-resistance state to that in the low-resistance state turned out to be much lager than that of the PCMO films without SRO buffer layers, Moreover, The reproducible property of the fabricated samples were improved. Origin of resistance change is not clear, but PCMO films with SRO buffer layers have the possibility of application for nonvolatile memory device.

Original languageEnglish
Title of host publicationAdvances in Nanomaterials and Processing - IUMRS - ICA - 2006 International Conference in Asia
PublisherTrans Tech Publications Ltd.
Pages17-20
Number of pages4
EditionPART 1
ISBN (Print)3908451310, 9783908451310
DOIs
StatePublished - 2007
EventIUMRS International Conference in Asia 2006, IUMRS-ICA 2006 - Jeju, Korea, Republic of
Duration: 10 Sep 200614 Sep 2006

Publication series

NameSolid State Phenomena
NumberPART 1
Volume124-126
ISSN (Print)1012-0394

Conference

ConferenceIUMRS International Conference in Asia 2006, IUMRS-ICA 2006
Country/TerritoryKorea, Republic of
CityJeju
Period10/09/0614/09/06

Keywords

  • Buffer layer
  • ReRAM
  • Resistance changes
  • SrRuO3

Fingerprint

Dive into the research topics of 'Role of SrRuO3 buffer layers in enhancing resistance changing of Pr0.7Ca0.3MnO3 films'. Together they form a unique fingerprint.

Cite this