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Silicon MEMS probe using a simple adhesive bonding process for permittivity measurement
Jung Mu Kim, Dong Hoon Oh, Jeonghoon Yoon, Sungjoon Cho, Namgon Kim, Jeiwon Cho, Youngwoo Kwon, Changyul Cheon, Yong Kweon Kim
Research output: Contribution to journal › Article › peer-review
2
Scopus
citations