Single-electron transistors with sidewall depletion gates on an SOI nanowire and their application to single-electron inverters

Dae Hwan Kim, Suk Kang Sung, Kyung Rok Kim, Jong Duk Lee, Byung Gook Park, Bum Ho Choi, Sung Woo Hwang, Doyeol Ahn

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

Single-electron transistors with sidewall depletion gates on a silicon-On-insulator (SOI) nanowire are proposed and were fabricated using a combination of conventional lithography and process technology. The island-size dependence of the electrical characteristics showed good controllability. Based on the high-voltage gain and the Coulomb oscillation peak position control by the sidewall gate voltage, the basic operation of a single-electron inverter was demonstrated at 12.5 K.

Original languageEnglish
Pages (from-to)505-508
Number of pages4
JournalJournal of the Korean Physical Society
Volume41
Issue number4
StatePublished - Oct 2002

Keywords

  • Depletion gate
  • Nanowire
  • Sidewall
  • Silicon-on-insuator
  • Single-electron inverter

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