Abstract
Single-electron transistors with sidewall depletion gates on a silicon-On-insulator (SOI) nanowire are proposed and were fabricated using a combination of conventional lithography and process technology. The island-size dependence of the electrical characteristics showed good controllability. Based on the high-voltage gain and the Coulomb oscillation peak position control by the sidewall gate voltage, the basic operation of a single-electron inverter was demonstrated at 12.5 K.
| Original language | English |
|---|---|
| Pages (from-to) | 505-508 |
| Number of pages | 4 |
| Journal | Journal of the Korean Physical Society |
| Volume | 41 |
| Issue number | 4 |
| State | Published - Oct 2002 |
Keywords
- Depletion gate
- Nanowire
- Sidewall
- Silicon-on-insuator
- Single-electron inverter