Sn-Ag-Cu to Cu joint current aging test and evolution of resistance and microstructure
- Di Erick Xu
- , Jasper Chow
- , Michael Mayer
- , Jae Pil Jung
- , Jong Hyun Yoon
- University of Waterloo
- KDone Co. Ltd.
Research output: Contribution to journal › Article › peer-review
9
Scopus
citations