Abstract
We introduce a SPICE-compatible model for a floating-dot single-electron memory (FDSEM), which includes both the single-electron box (SEE) model and the modified SOI MOSFET model. In this model, a surface potential model for SOI devices is developed. The accuracy of the developed model is verified with experimental data from FDSEM devices.
Original language | English |
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Pages (from-to) | 117-120 |
Number of pages | 4 |
Journal | Journal of the Korean Physical Society |
Volume | 44 |
Issue number | 1 |
State | Published - Jan 2004 |
Keywords
- SOI MOSFET
- SPICE
- Single-electron Box
- Single-electron memory