TY - GEN
T1 - State-space analysis of discrete-time disturbance observer for sampled-data control systems
AU - Yun, Hyeonjun
AU - Park, Gyunghoon
AU - Shim, Hyungbo
AU - Chang, H. J.
N1 - Publisher Copyright:
© 2016 American Automatic Control Council (AACC).
PY - 2016/7/28
Y1 - 2016/7/28
N2 - We present a state-space analysis of discrete-time disturbance observer (DOB) for a class of sampled-data control systems. Unlike the continuous-time case, it is well-known that sampling process may yield non-minimum phase zeros (called sampling zeros). Motivated by the truncated Taylor series (TTS) model which well describes the behavior of sampling zeros in the state-space, we present a condition for robust stability of the uncertain sampled-data control system with the discrete-time DOB. In particular, using the discrete-time singular perturbation theory, we show that the uncertain plant with disturbance behaves like a disturbance-free nominal model with the help of the discrete-time DOB.
AB - We present a state-space analysis of discrete-time disturbance observer (DOB) for a class of sampled-data control systems. Unlike the continuous-time case, it is well-known that sampling process may yield non-minimum phase zeros (called sampling zeros). Motivated by the truncated Taylor series (TTS) model which well describes the behavior of sampling zeros in the state-space, we present a condition for robust stability of the uncertain sampled-data control system with the discrete-time DOB. In particular, using the discrete-time singular perturbation theory, we show that the uncertain plant with disturbance behaves like a disturbance-free nominal model with the help of the discrete-time DOB.
UR - http://www.scopus.com/inward/record.url?scp=84992125519&partnerID=8YFLogxK
U2 - 10.1109/ACC.2016.7525587
DO - 10.1109/ACC.2016.7525587
M3 - Conference contribution
AN - SCOPUS:84992125519
T3 - Proceedings of the American Control Conference
SP - 4233
EP - 4238
BT - 2016 American Control Conference, ACC 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 American Control Conference, ACC 2016
Y2 - 6 July 2016 through 8 July 2016
ER -