Abstract
Absorption and dispersion of singlewalled carbon nanotube films were measured using an optoelectronic THz beam system for THz time-domain spectroscopy. The anisotropically aligned nanotube films were prepared through simple mechanical squeezing with a bar coater. The angle-dependent absorption and dispersion values were then measured. Results indicate that the index of refraction decreases with increasing frequency (0.1-0.8 THz), whereas the real conductivity increases with increasing frequency. The real conductivity measured is not congruent with the simple Drude model, but it follows a Maxwell-Garnett model, where the nanotubes are embedded in a dielectric host.
Original language | English |
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Pages (from-to) | 3403-3405 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 80 |
Issue number | 18 |
DOIs | |
State | Published - 6 May 2002 |