The characteristics of bottom-gate thin film transistor adapted nanocrystalline silicon as active layer by catalytic CVD at low temperature (< 200°C)
- Youn Jin Lee
- , Kyung Min Lee
- , Jae Dam Hwang
- , Kil Sun No
- , Sunghwan Won
- , Junghyun Sok
- , Kyoungwan Park
- , Wan Shick Hong
- University of Seoul
Research output: Contribution to conference › Paper › peer-review