Thickness dependence of resistive switching characteristics of the sol-gel processed Y2O3 RRAM devices

  • Kyoungdu Kim
  • , Hae In Kim
  • , Taehun Lee
  • , Won Yong Lee
  • , Jin Hyuk Bae
  • , In Man Kang
  • , Sin Hyung Lee
  • , Kwangeun Kim
  • , Jaewon Jang

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

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