Thickness-dependent electronic structure in ultrathin LaNiO3 films under tensile strain

Hyang Keun Yoo, Seung Ill Hyun, Young Jun Chang, Luca Moreschini, Chang Hee Sohn, Hyeong Do Kim, Aaron Bostwick, Eli Rotenberg, Ji Hoon Shim, Tae Won Noh

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27 Scopus citations

Abstract

We investigated electronic-structure changes of tensile-strained ultrathin LaNiO3 (LNO) films from ten to one unit cells (UCs) using angle-resolved photoemission spectroscopy (ARPES). We found that there is a critical thickness tc between four and three UCs below which Ni eg electrons are confined in two-dimensional space. Furthermore, the Fermi surfaces (FSs) of LNO films below tc consist of two orthogonal pairs of one-dimensional (1D) straight parallel lines. Such a feature is not accidental as observed in constant-energy surfaces at all binding energies, which is not explained by first-principles calculations or the dynamical mean-field theory. The ARPES spectra also show anomalous spectral behaviors, such as no quasiparticle peak at the Fermi momentum but fast band dispersion comparable to the bare-band one, which is typical in a 1D system. As its possible origin, we propose 1D FS nesting, which also accounts for FS superstructures observed in ARPES.

Original languageEnglish
Article number035141
JournalPhysical Review B
Volume93
Issue number3
DOIs
StatePublished - 29 Jan 2016

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