Thickness-dependent electronic structure in ultrathin LaNiO3 films under tensile strain

  • Hyang Keun Yoo
  • , Seung Ill Hyun
  • , Young Jun Chang
  • , Luca Moreschini
  • , Chang Hee Sohn
  • , Hyeong Do Kim
  • , Aaron Bostwick
  • , Eli Rotenberg
  • , Ji Hoon Shim
  • , Tae Won Noh

Research output: Contribution to journalArticlepeer-review

30 Scopus citations

Abstract

We investigated electronic-structure changes of tensile-strained ultrathin LaNiO3 (LNO) films from ten to one unit cells (UCs) using angle-resolved photoemission spectroscopy (ARPES). We found that there is a critical thickness tc between four and three UCs below which Ni eg electrons are confined in two-dimensional space. Furthermore, the Fermi surfaces (FSs) of LNO films below tc consist of two orthogonal pairs of one-dimensional (1D) straight parallel lines. Such a feature is not accidental as observed in constant-energy surfaces at all binding energies, which is not explained by first-principles calculations or the dynamical mean-field theory. The ARPES spectra also show anomalous spectral behaviors, such as no quasiparticle peak at the Fermi momentum but fast band dispersion comparable to the bare-band one, which is typical in a 1D system. As its possible origin, we propose 1D FS nesting, which also accounts for FS superstructures observed in ARPES.

Original languageEnglish
Article number035141
JournalPhysical Review B
Volume93
Issue number3
DOIs
StatePublished - 29 Jan 2016

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