Time-domain network analysis of MM-wave circuits based on photoconductive probe sampling technique

J. Kim; J. Son; S. Wakana; J. Nees; S. Williamson; J. Whitaker; Y. Kwon; D. Pavlidis

Time-domain network analysis of MM-wave circuits based on photoconductive probe sampling technique

J. Kim, J. Son, S. Wakana, J. Nees, S. Williamson, J. Whitaker, Y. Kwon, D. Pavlidis

Department of Physics

University of Michigan, Ann Arbor

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

7 Scopus citations

Abstract

We have developed a photoconductive probe sampling technique with 2-ps temporal resolution and μV sensitivity. Using the technique, we have measured S-parameters of millimeter-wave passive devices with a 120-GHz measurement bandwidth.

Original language	English
Title of host publication	IEEE MTT-S International Microwave Symposium Digest
Publisher	Publ by IEEE
Pages	1359-1362
Number of pages	4
ISBN (Print)	0780312090
State	Published - 1993
Event	Proceedings of the 1993 IEEE MTT-S International Symposium on Circuits and Systems, Part 4 (of 4) - Atlanta, GA, USA Duration: 14 Jun 1993 → 18 Jun 1993

Publication series

Name	IEEE MTT-S International Microwave Symposium Digest
Volume	3
ISSN (Print)	0149-645X

Conference

Conference	Proceedings of the 1993 IEEE MTT-S International Symposium on Circuits and Systems, Part 4 (of 4)
City	Atlanta, GA, USA
Period	14/06/93 → 18/06/93

Cite this

@inproceedings{8cad4d2524f84e238de621e26590c7b7,

title = "Time-domain network analysis of MM-wave circuits based on photoconductive probe sampling technique",

abstract = "We have developed a photoconductive probe sampling technique with 2-ps temporal resolution and μV sensitivity. Using the technique, we have measured S-parameters of millimeter-wave passive devices with a 120-GHz measurement bandwidth.",

author = "J. Kim and J. Son and S. Wakana and J. Nees and S. Williamson and J. Whitaker and Y. Kwon and D. Pavlidis",

year = "1993",

language = "English",

isbn = "0780312090",

series = "IEEE MTT-S International Microwave Symposium Digest",

publisher = "Publ by IEEE",

pages = "1359--1362",

booktitle = "IEEE MTT-S International Microwave Symposium Digest",

note = "Proceedings of the 1993 IEEE MTT-S International Symposium on Circuits and Systems, Part 4 (of 4) ; Conference date: 14-06-1993 Through 18-06-1993",

}

Kim, J, Son, J, Wakana, S, Nees, J, Williamson, S, Whitaker, J, Kwon, Y & Pavlidis, D 1993, Time-domain network analysis of MM-wave circuits based on photoconductive probe sampling technique. in IEEE MTT-S International Microwave Symposium Digest. IEEE MTT-S International Microwave Symposium Digest, vol. 3, Publ by IEEE, pp. 1359-1362, Proceedings of the 1993 IEEE MTT-S International Symposium on Circuits and Systems, Part 4 (of 4), Atlanta, GA, USA, 14/06/93.

Time-domain network analysis of MM-wave circuits based on photoconductive probe sampling technique. / Kim, J.; Son, J.; Wakana, S. et al.
IEEE MTT-S International Microwave Symposium Digest. Publ by IEEE, 1993. p. 1359-1362 (IEEE MTT-S International Microwave Symposium Digest; Vol. 3).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Time-domain network analysis of MM-wave circuits based on photoconductive probe sampling technique

AU - Kim, J.

AU - Son, J.

AU - Wakana, S.

AU - Nees, J.

AU - Williamson, S.

AU - Whitaker, J.

AU - Kwon, Y.

AU - Pavlidis, D.

PY - 1993

Y1 - 1993

N2 - We have developed a photoconductive probe sampling technique with 2-ps temporal resolution and μV sensitivity. Using the technique, we have measured S-parameters of millimeter-wave passive devices with a 120-GHz measurement bandwidth.

AB - We have developed a photoconductive probe sampling technique with 2-ps temporal resolution and μV sensitivity. Using the technique, we have measured S-parameters of millimeter-wave passive devices with a 120-GHz measurement bandwidth.

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M3 - Conference contribution

AN - SCOPUS:0027307173

SN - 0780312090

T3 - IEEE MTT-S International Microwave Symposium Digest

SP - 1359

EP - 1362

BT - IEEE MTT-S International Microwave Symposium Digest

PB - Publ by IEEE

T2 - Proceedings of the 1993 IEEE MTT-S International Symposium on Circuits and Systems, Part 4 (of 4)

Y2 - 14 June 1993 through 18 June 1993

ER -

Time-domain network analysis of MM-wave circuits based on photoconductive probe sampling technique

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