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Transparent and Flexible Zinc Tin Oxide Thin Film Transistors and Inverters using Low-pressure Oxygen Annealing Process

  • Kimoon Lee
  • , Yong Hoon Kim
  • , Jiwan Kim
  • , Min Suk Oh
  • Kunsan National University
  • Sungkyunkwan University
  • Korea Electronics Technology Institute

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

We report on the transparent and flexible enhancement-load inverters which consist of zinc tin oxide (ZTO) thin film transistors (TFTs) fabricated at low process temperature. To control the electrical characteristics of oxide TFTs by oxygen vacancies, we applied low-pressure oxygen rapid thermal annealing (RTA) process to our devices. When we annealed the ZTO TFTs in oxygen ambient of 2 Torr, they showed better electrical characteristics than those of the devices annealed in the air ambient of 760 Torr. To realize oxide thin film transistor and simple inverter circuits on flexible substrate, we annealed the devices in O2 of 2 Torr at 150 ◦ C and could achieve the decent electrical properties. When we used transparent conductive oxide electrodes such as indium zinc oxide (IZO) and indium tin oxide (ITO), our transparent and flexible inverter showed the total transmittance of ~ 68% in the visible range and the voltage gain of ~ 5. And the transition voltage in voltage transfer curve was located well within the range of operation voltage.

Original languageEnglish
Pages (from-to)1073-1077
Number of pages5
JournalJournal of the Korean Physical Society
Volume72
Issue number9
DOIs
StatePublished - 1 May 2018

Keywords

  • Enhancement-load inverter
  • Flexible
  • oxide
  • Thin film transistor
  • Transparent

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