Trapped charge modulation at the MoS2/SiO2 interface by a lateral electric field in MoS2 field-effect transistors
- Jinsu Pak
- , Kyungjune Cho
- , Jae Keun Kim
- , Yeonsik Jang
- , Jiwon Shin
- , Jaeyoung Kim
- , Junseok Seo
- , Seungjun Chung
- , Takhee Lee
- Seoul National University
- Korea Institute of Science and Technology
Research output: Contribution to journal › Article › peer-review
18
Scopus
citations