Trench field-effect transistors integrated in a microfluidic channel and design considerations for charge detection

Dong Wook Park, Gene Tsvid, Juan P. Hernandez-Ortiz, David C. Schwartz, Zhenqiang Ma

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Field-effect transistors (FETs) combined with a microfluidic system allow for the electrical detection of charged materials moving in a microfluidic channel. Here, we demonstrate trench-shaped silicon FETs with the combination of a microfluidic channel that can be used for simultaneous electrical and optical detection of charged fluorescent beads. The n-channel silicon trench FETs have a maximum transconductance of 1.83 × 10-5 S at near-zero gate bias voltage, which is beneficial for the high sensitivity of electrical detection. The optical transparency and physical robustness of the integrated microfluidic channel are achieved by a polydimethylsiloxane (PDMS)/glass hybrid cover combining the good sealing characteristics of PDMS, and the thin and flat properties of glass. Device evaluation methodologies and measurement approaches are also presented demonstrating a synchronized time-lapse imaging and electronic detection of bead transport. The proposed device and design consideration could advance the promise of electronic sensing to measure potential differences induced by charged analytes.

Original languageEnglish
Article number192102
JournalApplied Physics Letters
Volume120
Issue number19
DOIs
StatePublished - 9 May 2022

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