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Two-Dimensional Thickness-Dependent Avalanche Breakdown Phenomena in MoS2 Field-Effect Transistors under High Electric Fields

  • Jinsu Pak
  • , Yeonsik Jang
  • , Junghwan Byun
  • , Kyungjune Cho
  • , Tae Young Kim
  • , Jae Keun Kim
  • , Barbara Yuri Choi
  • , Jiwon Shin
  • , Yongtaek Hong
  • , Seungjun Chung
  • , Takhee Lee
  • Seoul National University
  • Korea Institute of Science and Technology

Research output: Contribution to journal › Article › peer-review

62 Scopus citations

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