Virtual framework for testing the reliability of system software on embedded systems

Sung Kwan Kim, Jongmoo Choi, Donghee Lee, Sam H. Noh, Sang Lyul Min

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

7 Scopus citations


System software development and testing on embedded systems can be quite difficult and time consuming. In this paper, we propose a cost effective method, namely virtual testing framework that can be used easily to test the reliability of system software. The framework consists of three layers; virtual platform layer, system software layer, and test environment layer. The virtual platform layer emulates a variety of embedded hardware on which any system software can be run and is used to verify its capability in handling faults injected by the test environment layer. We use the framework to verify the reliability of the file system and FTL (flash translation layer) by injecting faults that may be found in Flash memory. We discuss experimental results that we gained using this framework to gather post-fault behavior of the system software of interest.

Original languageEnglish
Title of host publicationProceedings of the 2007 ACM Symposium on Applied Computing
PublisherAssociation for Computing Machinery
Number of pages5
ISBN (Print)1595934804, 9781595934802
StatePublished - 2007
Event2007 ACM Symposium on Applied Computing - Seoul, Korea, Republic of
Duration: 11 Mar 200715 Mar 2007

Publication series

NameProceedings of the ACM Symposium on Applied Computing


Conference2007 ACM Symposium on Applied Computing
Country/TerritoryKorea, Republic of


  • FTL (Flash Translation Layer)
  • Fault injection
  • File system
  • Flash memory
  • Software testing
  • Virtual framework


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